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J-Link PRO PoE
The specialized high-end debug probe for test farms

J-Link PRO PoE is SEGGER's specialized programming and debug probe for creating test farms. It can draw power via Ethernet and supplies power to the target either via debug interface or a USB A connector.

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Documentation
J-Link PRO PoE – specialized high-end debug probe for test farms
  1. 1.Overview
    1. 1.1.Key features
  2. 2.What is a test farm?
  3. 3.Supported devices
  4. 4.Use cases
    1. 4.1.Communication tests
    2. 4.2.Compatibility tests
  5. 5.Ethernet
    1. 5.1.Power & safety (galvanic isolation)
    2. 5.2.Flexibility
  6. 6.USB power source and delivery
  7. 7.Software
    1. 7.1.Multi-platform
    2. 7.2.J-Flash
  8. 8.Speed
  9. 9.Flash Breakpoints
  10. 10.Ozone — The J-Link debugger
    1. 10.1.Standalone debugger
    2. 10.2.Performance analyzer
  11. 11.Media gallery
    1. 11.1.Product photos
    2. 11.2.Videos
  12. 12.Technical specifications
  13. 13.Package content
  14. 14.Mounting brackets
  15. 15.FAQ

Overview

Quality assurance requires testing and when it comes to testing – more is better.

The power supply of test devices can be controlled remotely. This enables automated reboot for the testing process as well as the ability to turn off devices not in use, making it easy to build large-scale test farms.

The built-in web server makes manual configuration easy. Ethernet allows the use of the debug probe far away from the PC, over a hardwired or wireless network, in a development or production environment. It also makes download and debugging speeds higher and provides electrical isolation from the PC.

Test farm setup using J-Link PRO PoE

Key features

  • PoE-enabled Ethernet interface
  • Switchable power out via USB-A or 20-pin header
  • Download speed up to 4 MB/s
  • Unlimited breakpoints in flash memory (Flash Breakpoints)
  • Use with Ozone, RDI/RDDI and J-Flash
  • Comes with web interface for easy TCP/IP configuration (built-in webserver)
  • Built-in VCOM functionality
  • Supports a broad range of microcontrollers
  • Supports direct download into RAM and flash memory
  • Free software updates

What is a test farm?

In terms of embedded systems, a test farm (or “board farm” or “device farm”) consists of a number of nodes (such as evaluation boards, prototype boards, production boards, finished products, etc.) connected to a network via debug probes, making them remotely accessible to testers or developers.

It is a very efficient way to share access to hardware that is in limited supply among a number of users. Additionally, automated build systems can run tests on the same standard setup, which is ideal for regression testing, continuous integration, compiler tests, and more.

Supported devices

The J-Link PRO PoE as a member of the SEGGER J-Link debug probes supports a wide range of CPU cores. The list of supported manufacturers, families, and devices and SoCs includes tens of thousands of devices in hundreds of device families.

Device not listed? Please don’t hesitate to contact us.

SEGGER Flasher PRO - Icon: Three black puzzle pieces above blue puzzle piece (Universal Target Support)

Use cases

There are a lot of use cases for almost any test setup for an embedded system. As soon as the number of devices to be tested grows, a test farm is inevitably required to ensure quality. A test farm using J-Link PRO PoEs may consist of multiple test devices of the same type or be completely different. We have described a couple of test cases below.

Communication tests

Communication reliability can only be tested with massive test setups that generates a huge amount of traffic on the communication channel. Specifically, wireless traffic, using protocols such as WiFi, ZigBee or Matter, is prone to interference and requires thorough testing in order to ensure operation even under bad conditions. Communication test setups therefore use heterogeneous targets to ensure interoperability with different devices as well as a huge number of similar devices to prove reliability.

Compatibility tests

Testing compatibility of an updated firmware module running on different platforms or of a compiler requires a setup using different devices. A test farm shortens test time by addressing the tests in parallel on multiple different targets and ensures, that any changes to the compiler or firmware module are tested thoroughly against all possible target devices.

Ethernet

J-Link PRO PoE features a PoE-enabled Ethernet interface as an alternative to the USB connection specifically to reduce the size of a cable harness in test farms.

J-Link PRO PoE – PoE enabled Ethernet connector

Power & safety (galvanic isolation)

With PoE the J-Link PRO PoE can be powered and communicated with via a single interface. Target systems are shielded from power surges as the Ethernet signal lines provide galvanic isolation of the J-Link PRO PoE (and the target system) from the network and development PC.

J-Link PRO: Safety (icon)

Flexibility

Due to the Ethernet interface, it is easy to connect a large number of probes with long distances between the development PC and the target system. You can set a default gateway for J-Link PRO PoE making it also possible to use it in large intranets.

J-Link PRO: Flexibility (icon)

USB power source and delivery

Power is delivered to the target through a USB-A host connector (USB2.0, power-only). Power can be supplied from the USB interface of the J-Link PRO PoE with around 400 mA at 5 V. If the J-Link PRO PoE is powered over Ethernet, the power supplied can go up to 1 A at 5V.
 

J-Link PRO PoE – target interface and switched target power supply

Software

All software is included free of charge. It comes with licenses for all J-Link related SEGGER software products, such as J-Link Unlimited Flash Breakpoints, Ozone, RDI/RDDI, J-Flash, J-Link GDB Server, providing the optimum debugging solution for professional developers.

The J-Link Software and Documentation Package is available here:

DownloadJ-Link Software and Documentation Pack

Multi-platform

As a multi-platform solution, J-Link PRO PoE comes with the setup and control software for Linux, macOS and Windows. Software and firmware updates are included. Similarly, use on all currently supported target devices, and any that will be added, is also included.

J-Flash

J-Flash is a part of the J-Link Software and Documentation Package and allows the programming of the internal and external flash memory of a microcontroller-based embedded system via J-Link.

Learn more about J-Flash...

J-Link PRO: J-Flash (icon)

Speed

Up to 4 MB/s download speed make J-Link PRO the fastest debug probe on the market. 

Learn more about flash programming speed...

J-Link PRO: Speed (icon)

Flash Breakpoints

The J-Link PRO comes with an additional feature, called Unlimited Flash Breakpoints. Unlimited Flash Breakpoints allow the user to set an unlimited number of breakpoints when debugging in flash memory.

Learn more about Unlimited Flash Breakpoints...

J-Link PRO: Flash Breakpoints (icon)

Ozone — The J-Link debugger

Ozone is the debugger for J-Link and J-Trace. It includes all well-known debug controls and information windows and makes use of the best performance of J-Link and J-Trace debug probes.

Standalone debugger

Ozone focuses on debugging. There are no compiler or project window distractions. All debug windows can be moved, resized and docked, to provide you with the workspace you need.

Ozone offers all well-known debug controls and information windows, and more. Instruction trace, power graph, live watches, and real-time terminal I/O further extend these capabilities.

Ozone: Debugging features (screen)
Debugging with Ozone

Performance analyzer

With J-Link's High-Speed Sampling technology, Ozone can sample and visualize an embedded system's variables over time. Checking values and flags in the debugger, while the target keeps running, is easy.

J-Link's power measurement features enable you to record the power consumption of your target device in a debug session. This is especially helpful when you are developing a low-power device and need to know how power consumption changes when you enable or disable certain components.

Ozone: Performance analysis features (screen)
Performance analysis with Ozone

Media gallery

Product photos

SEGGER J-Link PRO PoE debug probe
J-Link PRO PoE front
J-Link PRO PoE – PoE enabled Ethernet connector
J-Link PRO PoE host connector
J-Link PRO PoE – target interface and switched target power supply
J-Link PRO PoE target connector

Videos

SEGGER J-Link Tutorials: The J-Link Configurator

Mar. 2022 | 5:24 min
J-Link — J-Link Configurator

SEGGER J-Link Tutorials: The J-Link Commander

Mar. 2022 | 7:48 min
J-Link — J-Link Commander

SEGGER J-Link Remote Server: Accessing a J-Link, J-Trace or Flasher remotely - anywhere in the world

Mar. 2019 | 4:35 min
J-Link Remote Server — Intro

SEGGER J-Link PRO: Performance analysis on RISC-V

Jan. 2022 | 4:02 min
J-Link — Performance analysis

SEGGER J-Link PRO: An introduction to Cortex-M faults and how SEGGER's Ozone debugger can help

Aug. 2020 | 5:22 min
J-Link & Ozone — Intro Cortex-M Faults

SEGGER J-Link PRO: Analyzing Cortex-M faults using SEGGER's Ozone debugger

Aug. 2020 | 7:30 min
J-Link & Ozone — Cortex-M Faults analysis

   View more...

Technical specifications

General
Supported OSMicrosoft Windows (x86/x64), Linux (x86/x64/Arm), macOS (x86/Apple M1)
Electromagnetic compatibility (EMC)EN 55032, EN 55035
Operating temperature+5°C ... +60°C
Storage temperature-20°C ... +65 °C
Relative humidity (non-condensing)Max. 90% rH
Mechanical
Size (without cables)123mm x 68mm x 30mm
Weight (without cables)125g
Available interfaces
Ethernet interface100 Mbit/s
PoE supply voltagesIEEE 802.3af PoE type 1, class 3
USB interfaceUSB 2.0 (Hi-Speed)
Target interfaceJTAG/SWD 20-pin
USB-A (power only)
JTAG/SWD interface, electrical
Target interface voltage (VIF)1.2V ... 5V
Current drawn from target voltage sense pin (VTRef)< 25µA
Target supply voltage5V (when powered via USB)
5.25V (when powered via PoE)
Target supply currentMax. 400mA (when powered via USB)
1000mA (when powered via PoE)
Reset typeOpen drain with 100 Ohms series resistor. Can be pulled low or tristated
Reset low level output voltageVOL <= 10% of VIF
For the whole target voltage range (1.2V <= VIF <= 5V)
LOW level input voltage (VIL)VIL <= 40% of VIF
HIGH level input voltage (VIH)VIH >= 60% of VIF
For 1.2V >= VIF <= 3.6V
LOW level output voltage (VOL) with a load of 10 kOhmVOL <= 20% of VIF
HIGH level output voltage (VOH) with a load of 10 kOhmVOH >= 80% of VIF
For 3.6 <= VIF <= 5V
LOW level output voltage (VOL) with a load of 10 kOhmVOL <= 20% of VIF
HIGH level output voltage (VOH) with a load of 10 kOhmVOH >= 80% of VIF
JTAG/SWD interface, timing
Target interface speedMax. 50 MHz
SWO sampling frequencyMax. 100 MHz
Data input rise time (Trdi)Trdi <= 20ns
Data input fall time (Tfdi)Tfdi <= 20ns
Data output rise time (Trdo)Trdo <= 10ns
Data output fall time (Tfdo)Tfdo <= 10ns
Clock rise time (Trc)Trc <= 3ns
Clock fall time (Tfc)Trc <= 3ns
Analog power measurement interface
Sampling frequency200 kHz
Resolution50 uA

Package content

J-Link PRO PoE – specialized high-end debug probe for test farms
J-Link PRO PoE
J-Link PRO: 20-pin, 0.1" target ribbon cable
20-pin, 0.1" target ribbon cable
J-Link PRO: USB cable black
USB cable
Four separate clamp blocks on the left, two mounting clips mounted to a Flasher on the right

Mounting brackets

SEGGER's mounting brackets provide a reliable solution for securely fastening Flasher in-circuit programmers during use. Designed for stability and ease of use, these brackets also ensure a tidy and professional setup for test farms using J-Link PRO PoE debug probes.

The mounting brackets are available directly from the SEGGER shop.

Alternatively, we offer the option to 3D print the mounting brackets yourself. A downloadable ZIP file is provided, containing a STEP file for modifications, an STL file ready for 3D printing, and a PDF with detailed dimensions.

FAQ

Q: Can I use J-Flash with J-Link PRO?

A:  Yes. J-Link PRO comes with a license for J-Flash preinstalled on the probe itself. No license setup necessary, simply plug in J-Link PRO and start using J-Flash.

Q: What is the advantage of J-Link versus simple probes such as FTDI-based systems?

A:  J-Link has numerous advantages: the actual J-Link software supplied by SEGGER (which enables use with common IDEs), the availability of Unlimited Flash Breakpoints for the debugging of software which runs in the flash of microcontrollers, it’s high speed and it’s simple, fast download into flash memory.

In contrast to most simple probes, J-Link supports adaptive clocking as well as SWD and SWO. It also functions more stably, since it is not just a dump USB to JTAG converter. Instead, it uses the intelligence of the built-in CPU which provides more robust communication. This is especially so in situations where the target CPU runs at low clock speeds.

Q: May I work with more than one J-Link at the same time, on the same machine?

A:  Yes, you can connect an unlimited number of J-Links to your PC. No special configuration required; each J-Link is registered with its unique serial number on the PC. This enables you to have multiple J-Links connected at once.

Q: I have multiple Arm cores in my JTAG chain. How can I debug them (simultaneously) with J-Link?

A:  That's simple: Two or more debuggers can use the same J-Link simultaneously. Multi-core debugging requires multiple debuggers or multiple instances of the same debugger. You need to tell your debugger which device in the scan chain you want to debug. Additional special settings are not required.

Q: Does J-Link support the Embedded Trace Buffer (ETB)?

A:  Yes. J-Link supports ETB on Cortex-M3/M4/M7 and Cortex-A/R (if implemented by target device).

Q: Does J-Link support the  Micro Trace Buffer (MTB)?

A:  Yes.

Q: Does J-Link support the Embedded Trace Macrocell (ETM)?

A:  No. ETM requires another connection to the ARM chip and a CPU with built-in ETM. ETM is supported by the J-Trace product family.


Q: What is the maximum voltage that can be handled by the galvanic isolation of the Ethernet?

A:  The Ethernet data lines are isolated as required per IEEE 802.3 (test voltage 1500 Vrms for one minute). Note that this is NOT valid for the Ethernet shield that has a direct electrical contact to the USB shield and a resistive and capacitive coupling to probe GND. For an effective isolation, you need to use an unshielded twisted pair Ethernet cable.

Headquarters

SEGGER Microcontroller GmbH

Ecolab-Allee 5
40789 Monheim am Rhein, Germany
info@segger.com
Tel.: +49-2173-99312-0
Fax: +49-2173-99312-28

Locations

USA: SEGGER Microcontroller Systems LLC

Boston area
101 Suffolk Lane
Gardner, MA 01440, USA
us-east@segger.com
Tel.: +1-978-874-0299
Fax: +1-978-874-0599

Silicon Valley
Milpitas, CA 95035, USA
us-west@segger.com
Tel.: +1-408-767-4068

China: SEGGER Microcontroller China Co., Ltd.

Room 218, Block A, Dahongqiaoguoji
No. 133 Xiulian Road
Minhang District, Shanghai 201199, China
china@segger.com
Tel.: +86-133-619-907-60

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First-class embedded software tools since 1992
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